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Get nano‑IR spectra to understand nanomaterials at a level unattainable with conventional FTIR techniques.
Save your time for important work. PiF‑IR spectra are fast and easy to take with no finicky alignments or calibration standards needed.
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As low as0
* FTIR is diffraction limited to a resolution of about (10,000 nm )3 = 1×1012 nm3 while PiF‑IR has a resolution of less than (10 nm)3 = 1×103 nm3. Therefore, PiF‑IR is at least 1×109 times more precise.
Create chemical absorption maps of nano-scale features in a matter of minutes. Understand material phase distributions or contaminants and defects using high-resolution nano-IR images.
As little as0
for a 250px fixed-wavelength image
Avoid sample burning and get cleaner spectra with granular laser power notching for both PiFM and PiF‑IR. Create unlimited notches to maximize SNR without having to wait for averaging to drive down noise.
Leverage the power of FTIR libraries at an unprecedented scale. Existing FTIR spectra can be used to identify molecular fingerprints in PiF‑IR spectra.
Easily extract all possible information from a sample using our automated hyPIR™ imaging mode. This technology creates hyper-spectral images where every pixel contains a complete IR spectrum.
It doesn’t matter if you want to study organics, inorganic, or both simultaneously. Get the most information with the excellent mono-layer molecular sensitivity provided by PiFM and PiF‑IR. Plus, expand the techniques into other wavelength ranges including visible light for even more varied experiments.
Probe samples at different depths to get a 3D understanding of how materials are spatially related at the nano-scale.
People all over the world love and use Vista series microscopes. See the research published using our tools.
Understand why PiFM and PiF‑IR are the most capable nano-IR techniques by learning the principles behind how they work.
“We believe PiFM is poised to become a genuinely unique tool in the exploration of the phenomena derived in nanoscale systems. This new scanning probe imaging paradigm offers the distinctive prospect of detecting optically induced behavior without directly measuring the photon field created. A direct measure of induced photo-induced polarization/polarizability opens a very unique window in the study of complex materials systems. Moreover, exploiting resonance coupling of cantilever nano-mechanical modes as direct detectors of photo-mediated forces will allow phase-sensitive detection techniques to enable the sensitive observation of local optical responses with extraordinary nanoscale resolution.”
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