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Sharply Focused Azimuthally Polarized Beams with Magnetic Dominance: Near-Field Characterization at Nanoscale by Photoinduced Force Microscopy
Zeng, J., Huang, F., Guclu, C., Veysi, M., Albooyeh, M., Wickramasinghe, H., Capolino, F.
ACS Photonics
Abstract
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