Nanoscale spectroscopic studies of two different physical origins of the tip-enhanced force: dipole and thermal

Jahng, J., Park, S., Morrison, WA., Kwon, H.
arXiv preprint

Abstract

When light illuminates the junction formed between a sharp metal tip and a sample, different mechanisms can contribute to the measured photo-induced force simultaneously. Of particular interest are the instantaneous force between the induced dipoles in the tip and in the sample and the force related to thermal heating of the junction. A key difference between these two force mechanisms is their spectral behaviors. The magnitude of the thermal response follows a dissipative Lorentzian lineshape, which measures the heat exchange between light and matter, while the induced dipole response exhibits a dispersive spectrum and relates to the real part of the material polarizability. Because the two interactions are sometimes comparable in magnitude, the origin of the nanoscale chemical selectivity in the recently developed photo-induced force microscopy (PiFM) is often unclear. Here, we demonstrate theoretically and experimentally how light absorption followed by nanoscale thermal expansion generates a photo-induced force in PiFM, which hasn’t been revealed so far. Furthermore, we explain how this thermal force can be distinguished from the induced dipole force by tuning the relaxation time of samples. Our analysis presented here helps the interpretation of nanoscale chemical measurements of heterogeneous materials and sheds light on the nature of light-matter coupling in van der Waals materials.