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Publications
FIGURE 1. Spectral photoinduced force microscopy (PiFM) images of a polystyrene-poly(methyl methacrylate) (PS-PMMA) block copolymer sample with a pitch of 40nm. Left: Image at 1492cm_-1_. Center: Image at 1732cm_-1_. Right: Topography of sample. PiFM at 1492 and 1732c_-1_ images the PS and PMMA polymer components...
A new method is presented for visualizing the electric field distributions associated with propagating surface-plasmon-polariton (SPP) modes directly in the near-field. The method is based on detecting the photo-induced gradient force exerted by the evanescent field onto a sharp and polarizable tip. Using a photo-induced...
The enormous advances made in nanotechnology have also intensified the need for tools that can characterize newly synthesized nanoaterials with high sensitivity and with high spatial resolution. Many existing tools with nanoscopic resolution or better, including scanning electron microscopy (SEM), atomic force microscopy (AFM), and...
Photo-induced force microscopy produces images with spectroscopic contrast at nanometer scale resolution. In this presentation, the basic principles of the photo-induced force microscope are described and application examples of this technique are highlighted.
We perform time-resolved pump-probe microscopy measurements by recording the local force between a sharp tip and the photo-excited sample as a readout mechanism for the material’s nonlinear polarization. We show that the photo-induced force is sensitive to the same excited state dynamics as measured in...