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Announcing Vista 200

Check out our new semiconductor-specific instrument

Vista 75

The next generation of PiFM and PiF-IR instruments

Smaller footprint

Vista 75 has been made more compact. With a completely new acoustic enclosure, Vista 75 now takes up over 60% less space than Vista One.

Accessible design

Easy sample access and a one-handed AFM head clamp make tip and sample exchanges a breeze. The lightweight removable enclosure and open design make optical alignments easy.

Larger samples

With 75 mm of stage travel, sample size no longer matters! If it fits on the stage, Vista 75 can provide results.

Quick-change optics

Pre-aligned optics make switching between PiFM + PiF-IR, sSNOM, and Raman effortless.

Robust laser integration

A 3D-actuated PM mirror keeps excitation lasers aligned to the apex of the AFM tip for all types of tip-enhanced measurements, including PiFM, PiF-IR, s-SNOM, and tip-enhanced Raman.

Self-contained system

No need for a special environment. Vista 75 is complete with built in vibration isolation and a temperature controlled acoustic enclosure with dry air.

Ultimate spectro-nanoscopy


Sub-5 nm IR spatial resolution

PiFM chemical mapping provides unbeatable lateral IR resolution for analyzing surface chemistry.

An elementary cellulose fibril is embedded in the lignin matrix of a cell wall from spruce wood. Scan dimensions: 150 nm × 150 nm × 10.5 nm.

Single-molecule level sensitivity


PiF-IR spectra (magenta and green) show the chemical differences on and off these peptoid nano-sheet fragments.


PiFM chemical maps are able to detect peptoid fragments that are only 0.5 nm taller than the surrounding material!

Scan dimensions: 500 nm × 500 nm × 1.7 nm.


Vista 75 IR

Microscope: Vista 75 frame

Isolation: active vibration isolation table, and acoustic enclosure with temperature control

Laser(s): choice of QCL (770 – 1850 cm−1) or OPO/DFG (550 – 2050, 2250 – 4400 cm−1)

Multiplexer: medium (up to 3 laser inputs and polarization switching) or large size (up to 6 laser inputs plus polarization switching)

Add-ons (optional): polarization switcher, dry-air filtration, KPFM, cAFM, PFM, tip-enhanced Raman/PL, s-SNOM module

Vista 75 IR +s-SNOM

Everything in Vista 75 IR

Configured to operate concurrently with PiFM. Best-in-class detection scheme


  • Multiplexer: large size
  • Required add-ons: s-SNOM module (comes with Michelson interferometer for measurements of both near-field amplitude and phase)

Vista 75 IR +PL/Raman

Everything in Vista 75 IR

Configured to operate concurrently with PiFM. Tip-enhanced Raman/PL configuration via the integrated Parabolic Mirror


  • Laser(s): visible diode laser (also PiFM capable)
  • Multiplexer: large size
  • Required add-ons: tip-enhanced Raman/PL module


Stage and scanner

Sample stage travel: 75 mm, max sample 140 mm square

Scan size: 80 µm × 80 µm. (100 µm × 100 µm optional)

Dual Z Feedback: 12 µm z-scanner with 600 nm fast-z scanner provides both high bandwidth and a large z-range


Imaging modes: Non-contact AFM, PiFM, KPFM, FvD (Force vs distance) mapping, Raman, s-SNOM

Spectroscopy modes: PiF-IR, FvD, Raman

PiF Laser Options: QCL (770 – 1500 cm−1), OPO/DFG (550 – 2050, 2250 – 4400 cm−1)

Depth probed (IR): 20 nm and bulk

Physical requirements

Table size: 1.2 m × 2.4 m (4 ft × 8 ft) optical breadboard for complete system

Enclosure: Less than 13 kg, removable, acoustic insulation, temperature controlled with dry air

Don’t just see it. Identify it!

Recent PiFM Applications