Announcing Vista 200

Check out our new semiconductor-specific instrument

NCH-PtIr PiFM Cantilevers


Guaranteed to be contamination-free, our NCH-PtIr PiFM cantilevers are specifically designed to provide the best results for nano-IR experiments including PiFM, PiF-IR, and s-SNOM. The cantilevers are screened to ensure they will provide quick and reliable alignment as well as repeatable measurements. While similar cantilevers are available from other vendors, these are the only ones we can recommend without reservations.

These platinum-iridium coated tips are based on stiff cantilevers for non-contact mode AFM, and they have a custom metal coating. Platinum-iridium coated tips offer enhanced durability and excellent SNR on most samples. For more signal on some samples, we also offer gold coated tips. The pricing includes reusable storage containers with bonus cantilevers available for repeat customers.

Uncoated cantilever information

Note: These cantilevers are designed and manufactured for end users of our Vista series microscopes. If you are not an existing customer, please contact us prior to placing an order to ensure that these are an appropriate product for your application. Orders placed without prior contact may be cancelled at our discretion.

SKU: NCH-Au-PiFM-1 Category: