Infrared photo-induced force microscopy (IR PiFM) is an AFM-IR technique that records IR signals from surfaces with the resolution of atomic force microscopy. With a hybrid atomic force microscopy (AFM) optical spectroscopy platform, simultaneous IR spectra are acquired while mapping topography. Infrared wavelengths specific to different chemical entities resolve the nanometer-scale distribution of each chemical species in diverse multi-phase and multi-component systems. High spatial resolution of chemical species results from extreme surface sensitivity, complementing many existing surface analytical techniques.

PiFM applications include: Polymers, 1D/2D Materials, Nano Photonics, Nano Plasmonics, Bio Applications and Semiconductor Applications.