Come meet us at our next event!
2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Monterey Marriott in Monterey, California, on April 2-4, 2019
Scope of Conference: Innovative metrology and characterization methods required as the semiconductor industry moves to silicon nanoelectronics and beyond. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provide critical reviews of important semiconductor techniques.
Invited Speaker: Thomas Albrecht, Ph.D.
VP, Engineering and Technology, Molecular Vista, Inc.
PiFM Nanoscale Chemical Probe for Novel Patterning Applications
“Nanochemical Mapping of Inorganics with IR-PiFM”
Speakers: Thomas Albrecht, Ph.D. & Derek Nowak, Ph.D.
To view the recording, click here!