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Live Webcast : PiFM – Hyperspectral “Nano FT-IR” Imaging
Please join Molecular Vista on Tuesday, January 26th at 11am EST | 8am PST | 4pm GMT | 5pm CET for our free webcast, PiFM – Hyperspectral “Nano FT-IR” Imaging. This webcast will introduce photo-induced force microscopy (PiFM), a nanoscale IR spectroscopy/microscopy technique based on atomic force microscopy (AFM). It can produce topography, chemical maps, and IR absorption spectra with sub-10 nm spatial resolution with minimal sample preparation requirements and without inducing damage. After a brief introduction to the technique, a few application examples from biopharma and material research will be shared.
- PiFM (“Nano FT-IR”) vs FT-IR
- Nanoscale chemical analysis of defect/monolayer residue in modern biotech device manufacturing
- Applications to biopharma and material R&D
Key Learning Objectives:
- What PiFM is and how PiFM provides nanoscale molecular information (109 better than FT-IR)
- Flexibility and versatility of the technique (minimal sample prep, non-destructive, bio, organic, inorganic, etc.)
- Can easily evaluate the technology via contract service
Who Should Attend:
- R&D manager, scientists, engineers
- Failure & Analysis scientists
- Professors, postdocs, and graduate students
Unable to attend? All registrants receive a link to a recorded version of the webcast. Register today!
Derek received a Ph.D. in applied physics from Portland State University in 2010. He currently leads the product and customer applications team for optical force detection microscope development at Molecular Vista where he splits his time as a Staff Scientist and Director of Applications. As a member of the original development team and developer of many of the imaging modalities, Derek is thoroughly knowledgeable of the microscope’s capabilities. Derek uses his expertise to aid customers in new experimental techniques and complex data analysis. Many of these interactions with customers have resulted in joint publications using Photo-induced Force Microscopy (PiFM) research applications. Derek has conducted extensive hands-on research in near field techniques, including Tip Enhanced Near-field Optical Microscopy (TENOM), Tip Enhanced Raman Scattering (TERS), and force detection of near-field optical absorption Photo-induced Force Microscopy (PiFM).
Padraic O’Reilly has been with the application team at Molecular Vista Inc. since 2017. In his current role as an application scientist, he works closely with customers to develop experiments utilizing the broad range of AFM techniques available with the VistaScope, including Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), and Photo-induced Force Microscopy (PiFM). During his time with Molecular Vista, Padraic has garnered vast knowledge in the visible and IR PiFM technique through thousands of hours of hands-on experience with an extensive array of specimens from biological to inorganic. In addition, Padraic has practical experience in nanofabrication and nanoplasmonics from his time as a researcher at Chalmers University of Technology, Sweden.