Our Latest Webinar!
Webinar : Nanoscale Chemical Mapping via AFM-IR for Advanced Patterning Processes
Our latest free webinar explored nanoscale chemical mapping of advanced patterning processes. The capabilities of PiFM were highlighted by presenting data on various material systems with attention to advanced patterning techniques, including area selective ALD, directed self-assembly, and EUV photoresist characterization. Click to view a video recording of the event.
Photo-induced Force Microscopy (PiFM) combines atomic force microscopy (AFM) with infrared (IR) spectroscopy to acquire both topography and IR absorption data with sub-10 nm spatial resolution and monolayer sensitivity. PiFM works well with both organic and inorganic materials, making it ideal for examining atomic layer processes, such as area selective deposition (ASD) where a self-assembled monolayer (SAM) of organic molecules is used as an inhibitor to prevent the growth of an inorganic layer via atomic layer deposition (ALD).
IR PiFM spectra and packing density map of self-assembled monolayer (SAM) of octadecyltrichlorosilane (ODTS) on silicon oxide structure
Derek received a Ph.D. in applied physics from Portland State University in 2010. He currently leads the product and customer applications team for optical force detection microscope development at Molecular Vista where he splits his time as a Staff Scientist and Director of Applications. As a member of the original development team and developer of many of the imaging modalities, Derek is thoroughly knowledgeable of the microscope’s capabilities. Derek uses his expertise to aid customers in new experimental techniques and complex data analysis. Many of these interactions with customers have resulted in joint publications using Photo-induced Force Microscopy (PiFM) research applications. Derek has conducted extensive hands-on research in near field techniques, including Tip Enhanced Near-field Optical Microscopy (TENOM), Tip Enhanced Raman Scattering (TERS), and force detection of near-field optical absorption Photo-induced Force Microscopy (PiFM).
For Derek’s dissertation work, “The Design of a Novel Tip Enhanced Near-field Scanning Probe Microscope for Ultra-High Resolution Optical Imaging”, Derek implemented antenna-based geometries to determine different resonance conditions that would increase near-field signal-to-noise while suppressing background far-field contributions. To complete this work, Derek developed a custom SPM system from the ground up using custom FPGA code, electronics, mechanical design and software. Derek currently maintains a faculty appointment at Portland State University and has received many nominations for teaching excellence while he was a professor at Portland State University.
Padraic O’Reilly has been with the application team at Molecular Vista Inc. since 2017. In his crrent role as an application scientist, he works closely with customers to develop experiments utilizing the broad range of AFM techniques available with the VistaScope, including Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), and Photo-induced Force Microscopy (PiFM). During his time with Molecular Vista, Padraic has garnered vast knowledge in the visible and IR PiFM technique through thousands of hours of hands-on experience with an extensive array of specimens from biological to inorganic. In addition, Padraic has practical experience in nanofabrication and nanoplasmonics from his time as a researcher at Chalmers University of Technology, Sweden.
“Nanochemical Mapping of Inorganics with IR-PiFM”
Speakers: Thomas Albrecht, Ph.D. & Derek Nowak, Ph.D.
To view the recording, click here!