Events & Conferences

Come meet us at our next event!

The Molecular Foundry User Meeting
Lawrence Berkeley National Lab
Berkeley, California
August 15-16, 2018

Molecular Foundry User Meeting logo

Contributed Talk: Thursday, August 16
Symposium: Multimodal In-Situ Characterization of Hard/Soft Materials Across Interfaces and Multiple Scales, Parts I & II
Presenter: Sung Park, Ph.D., CEO Molecular Vista Inc.

AFM + Nanoscale Vista-IR Spectroscopy via Photo-induced Force Microscopy

Abstract: Photo-induced Force Microscopy (PiFM) combines optical spectroscopy and atomic force microscopy (AFM) via illumination of the tip-sample junction with tunable laser light and mechanical detection of forces acting on the tip in response to interaction of light with the sample. With infrared (IR) source, PiFM can map the IR absorption of the sample as a function of IR wavelength and position and achieve nm-scale resolution in displaying the locations of heterogeneous materials on the surface of a sample. Even for samples without active IR absorption band, PiFM can be used to acquire nanoscale mapping based on the dielectric constant of the sample surface; dielectric constant mapping also allows high resolution sub-surface mapping. With tunable visible and near infrared (VisNIR) laser source, PiFM can map exciton resonances with similar spatial resolution even on monolayer samples. Examples from various classes of samples including organic, inorganic, biological, and 2D materials will be presented.


IMRC 2018
Cancun, Mexico
August 19-24, 2018

IMRC 2018 Conference Logo for the International materials research Congress in Cancuc, Mexico

Presentation: Palenque Room, Wednesday, August 22, 12:30-2 PM PDT
Speaker: Sung Park, Ph.D., CEO Molecular Vista, Inc.

AFM + Nanoscale Vis-IR Spectroscopy via Photo-induced Force Microscopy

Abstract: Photo-induced Force Microscopy (PiFM) [1] combines optical spectroscopy and atomic force microscopy (AFM) via illumination of the tip-sample junction with tunable laser light and mechanical detection of forces acting on the tip in response to interaction of light with the sample.  With infrared (IR) source, PiFM can map the IR absorption of the sample as a function of IR wavelength and position and achieve nm-scale resolution in displaying the locations of heterogeneous materials on the surface of a sample.  Even for samples without active IR absorption band, PiFM can be used to acquire nanoscale mapping based on the dielectric constant of the sample surface; dielectric constant mapping also allows high resolution sub-surface mapping.  With tunable visible and near infrared (VisNIR) laser source, PiFM can map exciton resonances with similar spatial resolution even on monolayer samples.  Examples from various classes of samples including organic, inorganic, and 2D materials will be presented.  We will also present PiFM spectroscopy data that show excellent correlation with bulk FTIR spectra despite the fact that PiFM acquires local chemical information from regions in the range of 10 nm in extent.


Webinar
“Nanochemical Mapping of Inorganics with IR-PiFM”

Speakers: Thomas Albrecht, Ph.D. & Derek Nowak, Ph.D.
To view the recording, click here!

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