Events & Conferences

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FCMN 2019 logo (International Conference on Frontiers of Characterization and Metrology or Nanoelectronics)

2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Monterey Marriott in Monterey, California, on April 2-4, 2019

Scope of Conference: Innovative metrology and characterization methods required as the semiconductor industry moves to silicon nanoelectronics and beyond. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provide critical reviews of important semiconductor techniques.

Invited Speaker: Thomas Albrecht, Ph.D.
VP, Engineering and Technology, Molecular Vista, Inc.

PiFM Nanoscale Chemical Probe for Novel Patterning Applications


Webinar
“Nanochemical Mapping of Inorganics with IR-PiFM”

Speakers: Thomas Albrecht, Ph.D. & Derek Nowak, Ph.D.
To view the recording, click here!

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