Events & Conferences

Come meet us at our next event!

SciX 2018, Atlanta, GA

SciX 2018
Atlanta, GA, October 21-26

Speaker: Sung Park, Ph.D., CEO Molecular Vista, Inc.
“Chemically Selective IR-AFM Imaging for Advanced Lithography Techniques”
Extension of nano-scale AFM technology into chemical sensing provides great insight for R&D and failure analysis researchers 
18IR02: Applications of Nanoscale IR Spectroscopy to Polymeric Materials
Thursday, October 26, 2018, 2:50 PM

ISTFA 2018 banner

ISTFA 2018
44th International Symposium for Testing and Failure Analysis
Failures Worth Analyzing.
Phoenix Convention Center in Phoenix, AZ
Oct. 28 – Nov. 1, 2018

Speaker: Sung Park, Ph.D., CEO Molecular Vista, Inc.
“Nanoscale Chemical Mapping of Semiconductor Devices and Materials via PiFM”
Thursday, November 1, 2018, 8:00 AM

SpectroNanoscopy 2018 Workshop

SpectroNanoscopy 2018 Workshop
Koreana Hotel in Seoul, South Korea
December 5-7, 2018

Scope of Workshop: Synchrotron radiation based nanoscopy and spectro- nanoscopy, SPEM, STXM, TXM, XPEEM, LEEM,
and other related techniques.

Invited Speaker: Sung Park, Ph.D., CEO Molecular Vista, Inc.
“AFM + Nanoscale Vista-IR Spectroscopy via Photo-induced Force Microscopy”
Friday, December 7, 2018, 9:20-10:00 AM

FCMN 2019 logo (International Conference on Frontiers of Characterization and Metrology or Nanoelectronics)

2019 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Monterey Marriott in Monterey, California, on April 2-4, 2019

Scope of Conference: Innovative metrology and characterization methods required as the semiconductor industry moves moves to silicon nanoelectronics and beyond. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques.

Invited Speaker: Thomas Albrecht, Ph.D.
VP, Engineering and Technology, Molecular Vista, Inc.

“PiFM Nanoscale Chemical Probe for Novel Patterning Applications.”

“Nanochemical Mapping of Inorganics with IR-PiFM”

Speakers: Thomas Albrecht, Ph.D. & Derek Nowak, Ph.D.
To view the recording, click here!

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