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Better scanners for AFM-IR
Learn why AFM scanners play a key role in obtaining high-quality AFM-IR data.
An Introduction to AFM-IR
AFM-IR is a term used to categorize a wide range of nanoscale chemical characterization techniques. The name is a combination of Atomic Force Microscopy—AFM—and infrared spectroscopy—IR.
Webinar: Geoscience Applications of Photo-induced Force Microscopy for Nanoscale Chemical Imaging
Join Dr. Derek Nowak and Dr. Laura Otter to learn about geochemical research applications of Photo-induced Force Microscopy (PiFM)
A New Look: Celebrating 10 Years of Nanoscale Chemical Analysis
This year marks the 10-year anniversary of Molecular Vista. We started with a vision to…