Stay on top!
Get helpful articles and special offers once a month.
Get helpful articles and special offers once a month.
Our most advanced system with new automated features
As device sizes shrink, it becomes increasingly important to identify nanoscale defects as they directly…
A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In…
PiFM works effectively with both organic and inorganic materials, as demonstrated in a sample analyzing…
Silver nanowires underneath the protective layer are not visible in AFM topography and phase images.…
A sample that has undergone chemical mechanical polishing (CMP) is imaged via PiFM. While metals…
The longitudinal focal field of a tightly focused light via high NA (1.45 NA) objective…
The chemical analysis of solar cell materials is an excellent application of Vis-PiFM. In a…
In one of our earlier applications, we demonstrated PiFM’s capability in mapping the concentration of…