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Multi-layers of different materials find usage across various applications. The thicknesses of the layers range…
Advances in nanotechnology have intensified the need for analytical tools that can chemically characterize newly…
IR PiFM, with its ~5 nm spatial resolution holds tremendous potential for nanoscale chemical analysis. One…
On EUV exposure of t-BOC resists, topographic differences arise between exposed and unexposed masked areas.…
Topography, PiFM, and s-SNOM (at one harmonic of the dither frequency) images are acquired concurrently…
Surface plasmon polaritons (SPP) at the gold-air surface imaged via PiFM. p-polarized 809 nm laser…
As device sizes shrink, it becomes increasingly important to identify nanoscale defects as they directly…
A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In…
PiFM works well with both organic and inorganic materials. In ASD, organic self-assembled monolayers (SAMs)…
Silver nanowires underneath the protective layer are not visible in AFM topography and phase images.…
A sample that has undergone chemical mechanical polishing (CMP) is imaged via PiFM. While metals…