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PiF-IR Applications
Combining STEM and PiFM for Complementary Nanoscale Sample Analysis
Introduction Scanning Transmission Electron Microscopy (STEM) is a premier imaging and analytical technique that combines…
Unambiguous Nanoscale Characterization of Self Assembled Monolayer Coverage
Introduction Surface functionalization via SAM (self-assembled monolayer) coverage is utilized in a range of fields,…
Surface-Sensitive Characterization of ALD Films on Drug Particles: How PiFM Outperforms Conventional Techniques
Introduction Coating the surface of acetaminophen particles with Al₂O₃ and ZnO via atomic layer deposition…
Measurement of -OH termination on hydrophilic surfaces
Background For successful Cu-Cu hybrid bonding to occur in the most demanding advanced packaging, the…
Analyzing sub-20 nm defects and ultrathin (~1 nm thick) residues in semiconductor processes
Background With shrinking semiconductor device sizes and modern advanced packaging processes, it is crucial to…
Nano Chemical Characterization Uncovers Coating Issues for Monolayer Surface Functionalization
Background Modifying surfaces to influence subsequent molecular interactions is a powerful technique. By adding functional…
Reverse Engineer a Pre-cooked Rice Package
Background Multilayer films have been utilized in packaging food and drink for many years as…
Analyzing Forensic Trace Evidence with IR PiFM
Background Trace Evidence Analysis is the discipline of forensic science that deals with the minute…
Analyzing Mixed Nanoplastics for Environmental Studies
Microplastics, defined as plastic fragments less than 5 mm in length, are classified as primary or secondary...
Investigating Nanoscale Drug Delivery Systems With Nano-IR Analysis
Various forms of nano-particles are being utilized as part of nanoscale drug delivery systems. Most…
AFM-IR Chemical Analysis of Nanoscale Defects and Residues
Of critical importance in many manufacturing processes is the management of defects.
Visible PiFM
While PiFM provides excellent nanoscale chemical mapping and spectral analysis capabilities when coupled with broadly…