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PiF-IR Applications
Analyzing sub-100 nm particulate defects and ultrathin (~1 nm thick) residues in semiconductor processes
Background For semiconductor processes, it is crucial to eliminate sub-100 nm particulate defects and surface…
Nano Chemical Characterization Uncovers Coating Issues for Monolayer Surface Functionalization
Background Modifying surfaces to influence subsequent molecular interactions is a powerful technique. By adding functional…
Reverse Engineer a Pre-cooked Rice Package
Background Multilayer films have been utilized in packaging food and drink for many years as…
Analyzing Forensic Trace Evidence with IR PiFM
Background Trace Evidence Analysis is the discipline of forensic science that deals with the minute…
Analyzing Mixed Nanoplastics for Environmental Studies
Microplastics, defined as plastic fragments less than 5 mm in length, are classified as primary or secondary...
Investigating Nanoscale Drug Delivery Systems With Nano-IR Analysis
Various forms of nano-particles are being utilized as part of nanoscale drug delivery systems. Most…
AFM-IR Chemical Analysis of Nanoscale Defects and Residues
Of critical importance in many manufacturing processes is the management of defects.
Visible PiFM
While PiFM provides excellent nanoscale chemical mapping and spectral analysis capabilities when coupled with broadly…
Surface Sensitivity of PiFM
Since photo-induced force (PiF) is generated from the tip-enhanced field, which extends only about 20…
Study of Organic-Inorganic Compound vs PiFM
Block-selective infiltration with inorganics such as metal oxides on self-assembled block copolymer patterns should provide…
Spatial Resolution of PiFM
PiFM achieves excellent spatial resolution. Since our Science Advances paper [1], we have enhanced the…
Atomic-level Processing
As integrated circuit devices continue to shrink, surface layers have become a significant fraction of…