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Semiconductor Applications
Cross-section of Multilayer Stack
A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In…
ASD Area Selective Deposition Imaging with PiFM
PiFM works effectively with both organic and inorganic materials, as demonstrated in a sample analyzing…
Buried Silver Nanowires in Conductive Layer
Silver nanowires underneath the protective layer are not visible in AFM topography and phase images.…
Visualizing CMP by Dielectric Constant PiFM Imaging
A sample that has undergone chemical mechanical polishing (CMP) is imaged via PiFM. While metals…
Visualize Nanoscale Absorption in Perovskite Photovoltaic Film using Vis-PiFM
The chemical analysis of solar cell materials is an excellent application of Vis-PiFM. In a…
Cross-section of a Semiconductor Trench
Vista-IR images a cross-section of a semiconductor trench via PiFM, highlighting two different materials based on their unique IR absorption bands.
Silicon Strain in Semiconductor Devices
Carrier mobility enhancement through local strain in silicon is a means of improving transistor performance.…