
Vista-IR-S
While PiFM enjoys excellent traits such as ~5 nm spatial resolution and monolayer sensitivity on…
While PiFM enjoys excellent traits such as ~5 nm spatial resolution and monolayer sensitivity on…
Since photo-induced force (PiF) is generated from the tip-enhanced field, which extends only about 20…
As integrated circuit devices continue to shrink, surface layers have become a significant fraction of…
Multi-layers of different materials find usage across various applications. The thicknesses of the layers range…
On EUV exposure of t-BOC resists, topographic differences arise between exposed and unexposed masked areas.…
Topography, PiFM, and s-SNOM (at one harmonic of the dither frequency) images are acquired concurrently…
A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In…
PiFM works well with both organic and inorganic materials. In ASD, organic self-assembled monolayers (SAMs)…
Silver nanowires underneath the protective layer are not visible in AFM topography and phase images.…
A sample that has undergone chemical mechanical polishing (CMP) is imaged via PiFM. While metals…
The chemical analysis of solar cell materials is an excellent application of Vis-PiFM. In a…