Cross-section of Multilayer Stack

A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In the three sample sites imaged below, three different materials are highlighted based on the unique IR absorption bands for each material. The excellent spatial resolution of PiFM is demonstrated for “material 1” where PiFM clearly highlights thin layers that are not recognizable in topography.

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Geoscience Applications of PiFM for Nanoscale Chemical Imaging

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