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Applications
Nanoscale Defect Analysis
As device sizes shrink, it becomes increasingly important to identify nanoscale defects as they directly…
Cross-section of Multilayer Stack
A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In…
ASD Area Selective Deposition Imaging with PiFM
PiFM works effectively with both organic and inorganic materials, as demonstrated in a sample analyzing…
Buried Silver Nanowires in Conductive Layer
Silver nanowires underneath the protective layer are not visible in AFM topography and phase images.…
Visualizing CMP by Dielectric Constant PiFM Imaging
A sample that has undergone chemical mechanical polishing (CMP) is imaged via PiFM. While metals…
Visualization of Hermite Gaussian Focal Spot
The longitudinal focal field of a tightly focused light via high NA (1.45 NA) objective…
Visualize Nanoscale Absorption in Perovskite Photovoltaic Film using Vis-PiFM
The chemical analysis of solar cell materials is an excellent application of Vis-PiFM. In a…
Nanoscale Chemical Imaging of Soft Biological Tissues
In one of our earlier applications, we demonstrated PiFM’s capability in mapping the concentration of…
Bioplastic Nanocomposite – PLA, PiFM and Ecology
With global attention on the role that plastics play in our ecosystem, many researchers are investigating bioplastic alternatives such as polylactic acid.
Cross-section of a Semiconductor Trench
Vista-IR images a cross-section of a semiconductor trench via PiFM, highlighting two different materials based on their unique IR absorption bands.
Bacteriophage M13 and Plasmid DNA pUC1
Given the height of the bacteriophage M13 (3-4 nm), a single bacteriophage may have been imaged...
Meteorite – A Search for Organic Compounds
Molecular Vista's technology deconvolves the chemical composition of a meteorite...