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Applications
Cross-sectional IR PiFM Analysis
Multi-layers of different materials find usage across various applications. The thicknesses of the layers range…
Chemical Mapping
Advances in nanotechnology have intensified the need for analytical tools that can chemically characterize newly…
Understanding PiF-IR Spectra
IR PiFM, with its ~5 nm spatial resolution holds tremendous potential for nanoscale chemical analysis. One…
3D Nanoscale Analysis of Polymer Systems
In this note, we will demonstrate the elegance and utility of the technique by analyzing amphiphilic siloxane-polyurethane (AmSi-PU) coatings...
PiFM Imaging of Latent EUV in t-BOC CA Resist
On EUV exposure of t-BOC resists, topographic differences arise between exposed and unexposed masked areas.…
PiFM and Multimodal Imaging of HAMR Devices
Topography, PiFM, and s-SNOM (at one harmonic of the dither frequency) images are acquired concurrently…
Surface Plasmon Polaritons Visualized with PiFM
Surface plasmon polaritons (SPP) at the gold-air surface imaged via PiFM. p-polarized 809 nm laser…
Nanoscale Defect Analysis
As device sizes shrink, it becomes increasingly important to identify nanoscale defects as they directly…
Cross-section of Multilayer Stack
A multilayer stack grown on silicon is cross-sectioned (via cleaving) and imaged by PiFM. In…
ASD Area Selective Deposition Imaging with PiFM
PiFM works well with both organic and inorganic materials. In ASD, organic self-assembled monolayers (SAMs)…
Buried Silver Nanowires in Conductive Layer
Silver nanowires underneath the protective layer are not visible in AFM topography and phase images.…
Visualizing CMP by Dielectric Constant PiFM Imaging
A sample that has undergone chemical mechanical polishing (CMP) is imaged via PiFM. While metals…