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Infrared photo-induced force microscopy (IR PiFM) is an AFM-IR technique that records IR signals from surfaces with the resolution of atomic force microscopy. With a hybrid atomic force microscopy (AFM) optical spectroscopy platform, simultaneous IR spectra are acquired while mapping topography. Infrared wavelengths specific to different chemical entities resolve the nanometer-scale distribution of each chemical species in diverse multi-phase and multi-component systems. High spatial resolution of chemical species results from extreme surface sensitivity, complementing many existing surface analytical techniques