Get an inside look at the Vista-IR with Thomas Albrecht and Derek Nowak! Our webinar “Nanochemical Mapping of Inorganics with IR-PiFM” will be followed by Q&A on October 4th, 2017 at 11 AM PDT. Register today!

Description:

Our highly versatile Vista-IR uses IR Photo-induced Force Microscopy to create chemical maps of sample surfaces. We will be focusing on applications which involve nanoscale structures of inorganic material. IR-PiFM is an AFM technique which integrates IR light spectroscopy with an unprecedented spatial and chemical sensitivity, often referenced as IR AFM or AFM IR. Learn more…

Speakers:

Thomas Albrecht, PhD
VP of Engineering and Product Development, Molecular Vista, Inc.

Derek Nowak, PhD
Director of Applications, Molecular Vista, Inc.

Registration is now closed. For a recording of the webinar, please follow this link: “Nanochemical Mapping of Inorganics with IR-PiFM”