Tip-enhanced near-field optical microscopy (TENOM) combines a scanning probe microscope (atomic force microscope or scanning tunneling microscope) with optical spectroscopy techniques to extend the spatial resolution of the spectroscopy beyond the diffraction limit.  In TENOM, the sharp metal tip acts as a near-field antenna to relay information from the near-field to a far-field detector.  The most common forms of TENOM (TERS, s-SNOM, and PTIR) are briefly discussed  and contrasted with our revolutionary photo-induced force microscopy (PiFM) in the following articles.

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