VistaScope


VistaScope

VistaScope is a unique AFM with the most flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced optical microscopy as well as co-located AFM and optical techniques.

  

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    Photo-induced Force Microscopy (PiFM)

    – a revolutionary way to achieve near-field imaging via mechanical force detection.

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    Background Suppressed Scattering SNOM

    with built-in interferometer and patented demodulation technique, which allows collection of artifact-free information with the best SNR.

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    Tip-enhanced Raman Spectroscopy (TERS)

    A tuning-fork AFM head is available for TERS implementation.

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    Nanoscale Ultrafast Dynamic Studies

    Chemistry at the limit of space and time.

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    Confocal Raman and Photoluminescence (PL)

    Co-located far-field techniques with AFM and PiFM are straightforward. In this example, PL-I and PL-PM are collected at different times from inverted objective lens (0.9NA) and integrated parabolic mirror (PM) respectively using a SPAPD; a notch filter is used to collect signals primarily from the single layer portion of the MoS2 sample.


VistaScope

VistaScope is a unique AFM with the most flexible & full optical access to the tip/sample region. The VistaScope controller comes equipped with multiple lock-in amplifiers that allow patented photo-induced force microscopy (PiFM) and patented demodulation technique for background suppressed scattering scanning near-field optical microscopy (s-SNOM). It provides the ultimate capability in tip-enhanced optical microscopy as well as co-located AFM and optical techniques.
  

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    AFM Head & Integrated Parabolic Mirror

    The integrated high NA parabolic mirror on a 3D slip-stick stage (with 30 micron XYZ scanning motion) allows easy side illumination/collection to/from tip-sample region.

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    Top/Side/Bottom Optical Access

    High NA access to tip-sample region from all directions for co-located far-field and tip-enhanced optical measurement with SPM imaging.

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    3D Scanning Stage for Inverted Objective Lens

    3D piezo scanner stage for the inverted objective lens allows tip-enhanced near-field imaging on transparent substrates.

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    Dual-Z Feedback for Oil-Coupled Inverted Lens

    A combination of slow-z and fast-z piezos allows stable AFM operation even with oil-coupled inverted objective lens.

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    Multiple Optical Ports

    Extra ports allow integration of additional lasers, detectors, and spectrometers.

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    Vacuum Environment

    Low vacuum is provided for environmental control and operation with high Q sensors for ultra high sensitive detection techniques (FM-PiFM, FM-KPFM, etc.) as well as for dry N2 purge.

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    Optional AFM Heads

    UTV (unobstructed top view) AFM head and FFTF (front facing tuning fork) AFM heads. XY flexure scanner (12 x 12 micron) is integrated into both heads to offer more flexibility.

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    Powerful & Versatile Controller

    VistaScope controller supports most of the standard AFM modes in addition to multi-modal AFM, PLL, PiFM, s-SNOM, and optical detectors/spectrometers.


Beam Deflection AFM Head (AFM-BD)

Body Material: Invar for excellent thermal stability
Body Profile: 11 mm thick
AC Detector Noise: <25 fm/root Hz above 100 KHz
Detector Bandwidth: 6 MHz
BB Laser Source: 650 nm or 904 nm
Focus Size: Adjustable to accommodate various cantilevers including the ultra-small ones for high speed imaging
Manual Translation Stage: 3 mm movement in XY for coarse tip alignment to external laser (for tip-enhanced spectroscopy)
Fast-Z Module: 1 um z-piezo as the fast-Z element of Dual-Z feedback system
Operational Mode: ambient or open liquid cell
Optional Component: Integrated parabolic mirror with 3D piezo-motor stage for reflection mode PiFM and s-SNOM

Forward Facing Tuning Fork AFM Head (AFM-FFTF)

Body Material: Invar for excellent thermal stability
TF Operation: Tapping-mode
Manual Translation Stage: 3 mm movement in XY for coarse tip alignment to external laser (for tip-enhanced spectroscopy)
Integrated Tip Scanner: XY flexure stage scanner for the TF with 12 um x 12 um range
Fast-Z Module: 1 um z-piezo as the fast-Z element of Dual-Z feedback system

Main Body Frame

A custom designed inverted optical microscope with compact and rigid frame serves as the platform for super high resolution microscopy.
Inverted Objective Lens: 100X, 1.4NA Oil; 60X, 0.9A Air
Tip Alignment Mechanism: Piezo-driven XYZ stage (12 um for XY and 100 um for Z) for the inverted objective lens for precise alignment of the focus spot onto the tip
Top Objective Lens: 20X, 0.6NA
Top Objective Lens Focus: Motorized
Illumination: Software controlled LED
CCD Camera: Concurrent top and inverted views with 1280 x 1024 pixels each; digital zoom, pan, and capture
Tip-Sample Approach: Automated engagement via 3 stepper motors
Sample Stage: Motorized precision stage with 6 mm x 6 mm travel range
Maximum Sample Size: 25 mm x 25 mm x 5 mm
System Noise: <50 pm RMS (dependent on environment)
Optical Configuration: Based on standard 1″ cage system for expansion flexibility
Side Optics Module: Available as option for PiFM, scattering SNOM, and TERS on opaque samples
Sample Scanner: XYZ flexure stage scanner with 30 um x 30 um x 7 um scanning range (closed loop); 40 um x 40 um x 10 um for open loop; Z sample scanner serves as the slow Z component of Dual-Z feedback system; other ranges available upon request
Scanner Material: Invar for excellent thermal stability
Scanner Sensor Noise: 1 nm for XY with 40 kHz bandwidth 0.5 nm for Z with 40 kHz bandwidth
Optional Components: Active vibration isolation table for low noise performance

High-Speed Electronics

FPGA-based control electronics has a section dedicated for high speed scanning probe microscopy.
Sampling Rate: >500 MHz for channels A & B; Channel A dedicated for photodiode detection for high speed AFM
Lockin Amplifiers: 4 independent 2-phase lockin amplifiers (LIA0 to LIA3)
LIA Operation Frequency: Up to 10 MHz
High Speed Sine Wave Generator: Two channels with 160 MHz sampling rates; one reserved for scan generator for high speed AFM
High Speed Feedback Mode: Dual-Z feedback where the sample scanner tracks the slow varying topography and the Fast-Z Module in the AFM head tracks the fast varying topography
Maximum Feedback Throughput: 1 Mps with Dual-Z feedback

Standard-Speed Electronics

ADCs: 8X 24-bit, 156 kHz; 4X 24-bit, 156 kHz
DACs: 8X 24-bit 156 kHz; 2X 24-bit 156 kHz; 1X 20-bit, 156 kHz
Stepper Motor Control: 3 channels
DC Motor Control: 3 channels with encoders and Schmitt-Trigger for improved signal quality
HV-Amplifiers: 10 channels
Noise Floor for Scan HV-Amplifiers: 140 uVrms for 150V full range

PiFM & Optics Electronics

Electronics for PiFM includes:
TTL Signal Generator: Two flexible TTL signal generators (with 160 MHz sampling rate) with adjustable duty cycle and DC offset for direct current modulation of laser diodes or for input to Bragg cells
Flexible Lockin Referencing: The LIAs can be phase locked to any other LIA or at any calculated frequencies from the other LIAs
Digital Counter Input: Input for APD and PMT for low-lighting imaging

Computer

Mounted in a 19″ rack. Minimum configuration includes 3.4GHz Quad Core, 4GB RAM, 256GB SSD and 2000GB HD combination, 26″ or larger monitor, 8X USB ports, Windows 7 Professional

VistaScan Image Acquisition Software

Supported modes/features include:
Contact and AC AFM
STM and PLL feedback (for high Q sensors such as tuning-fork)
Ultrafast Dual-Z feedback
Q-control
Bi-modal force gradient imaging for linear and non-linear PiFM
Sideband force gradient imaging (for KPFM via electric force gradient detection)
Concurrent acquisition of 26 channels in Dual-Z configuration and 40 channels in Slow-Z configuration
Concurrent acquisition of 4 channels for each spectroscopy mode which may include
vs gap distance
vs bias with and without feedback
step response to voltage response with and without feedback

SurfaceWorks Image Analysis Software

Powerful and intuitive software. Features include:
Shape and histogram-based masks
Functions and analysis (flattening, FFT filtering, line & region analysis, 3D rendering, palettes, etc) applied to an image saved as a file property along with the raw data file
Copy/Paste file property to apply same functions and analysis to other image file(s)
Preview feature for most functions

Acoustic Enclosure

An optional acoustic enclosure (30W x 30D x 27H in3) can be ordered with or without temperature control; comes with ports for cables as well as optical access

Specifications subject to change without notice.