Vista-IR


Vista-IR

Vista-IR combines AFM with IR (AMF-IR) spectroscopy to provide IR spectral imaging with unprecedented sub-10 nm spatial resolution. Its patented photo-induced force microscopy (PiFM) measures the near-field optical response of the sample via mechanical force detection, making the technique robust and easy-to-use. Reliable and repeatable PiFM spectrum from 10-nm region provides “nano-FTIR” spectrum in less than a second.
 

  •   

    Nano IR Spectroscopy

    PiFM spectrum from a nanoscale region (lateral size ~10 nm) of Poly(2-vinylpyridine) correlates well with its bulk FTIR spectrum.

  •    

    Nano Chemical Analysis of Organics

    Nanoscale chemical mapping of organics and biomolecules based on their IR vibrational modes.

  •    

    Nano Chemical Analysis of Inorganics

    Nanoscale chemical mapping of inorganics and biomolecules based on their IR vibrational modes.

  •  

    Topography-Chemical-Electronic Correlations

    Correlation of AFM topographic, chemical (PiFM), and electronic (KPFM) properties on the same location.

  •  

  •    

    “Nano-FTIR” Spectra Across an Interface

    Point spectrum from any nano-region in the image can be acquired in rapid sequence to analyze subtle chemical variations.

  •    

    Plasmon Mapping in 1D/2D Materials

    Evanescent field mapping of plasmon polariton in 1D/2D materials via force detection of dipole-dipole interaction.

  •    

    E-field Mapping

    E-field mapping of photonic devices and plasmonics based on force detection of dipole-dipole interaction.


Vista-IR

Vista-IR comes equipped with a mid-IR laser with the widest tuning range and the best beam stability. The same laser can be used for imaging, extremely fast spectrum acquisition, and even for additional techniques such as scattering scanning near-field microscopy (s-SNOM option must be added). Many automated and user-aid features make the tool robust and as easy as using a standard AFM.
 

  •    

    Widely Tunable Mid-IR Source

    Continuously tunable over 1,000 cm-1 with 1 cm-1 resolution with enough power to generate point spectrum in about ~0.1 sec.

  •    

    Automated Setup

    PiFM setup is simple – the software detects the two cantilever resonances automatically and sets up the laser so that both AFM topography and PiFM images are acquired concurrently.

  •  

    Simple Alignment

    Cantilever is auto-aligned for AFM detection via cantilever alignment chip. IR beam alignment is as simple as taking a 15-second beam profile image (acquired by scanning the parabolic mirror) and clicking the center of the beam profile.

  •    

    hyPIR ® – Mapping

    hyPIR (hyperspectral PiFM IR) mapping consists of PiFM spectrum in each pixel of (n x n) pixel-image. It is like taking a thousand PiFM images and stacking them on top of each other.

  •    

    High NA (1.45) Inverted Optics

    High NA inverted objective lens on 3D piezo scanner for confocal and tip-enhanced optical measurements on transparent substrates.

  •    

    Additional Capabilities

    Please visit the VistaScope pages to see the additional capabilities that can be added onto Vista-IR (Right: confocal Raman image of strained silicon)