Complimentary sample analysis and PiFM demo on your own samples at ACS 2017: We are offering demos on samples you bring to ACS Fall in Washington, D.C. this year. Demo spaces are limited, so email us today at email@example.com to reserve a demo slot! firstname.lastname@example.org
Come and join us at TERS6! We’re looking forward to showcasing the PiFM technique and the Vista-IR instrument at the upcoming TERS6 event. We’ll have many activities during the conference including: Live Demos – Live demonstrations of the instrument and PiFM technique throughout the show, Wednesday (8/16), Thursday (8/17) and Friday (8/18) Your Samples – […] Read more
The spatial resolution of AFM IR instrument is determined by several criteria: (1) effective volumes of the tip and sample that are interacting; (2) sensitivity of the detection technique; and (3) background signal that will determine the signal-to-noise. The table below shows how PiFM compares with the competing techniques in these areas: As can be […] Read more
Since the dipole-dipole interaction between the induced sample dipole and the image tip dipole varies with ~ 1/z4 dependence where z is the tip-sample spacing, PiFM is expected to provide extreme surface sensitivity. We use PS(polystyrene)-b-PTMSS[poly(4-trimethylsilylstyrene)] block copolymer (BCP) with horizontal lamellae to demonstrate the surface sensitivity. The pitch L0 of the BCP is ~22 […] Read more
The PiFM paper called Photoinduced Force Mapping of Plasmonic Nanostructures from Rice University was featured in an article at phys.org titled “Light provides pull for future nanocatalyst measurement”. The article can be found here.
Our paper titled “Nanoscale chemical imaging by photo-induced force microscopy” is published on the online publication of Science journal, Science Advances, today. The paper introduces infrared PiFM imaging on two block copolymer systems, PS-b-PMMA and PS-b-P2VP. By using infrared wavelengths that correspond to the absorption bands for each of the polymer components, each chemical component […] Read more
Junghoon Jahng et. al. have published a theoretical and experimental analysis of the dominant forces measured in PiFM in a paper titled “Gradient and scattering forces in photoinduced force microscopy.” They conclude that both optically induced dipole-dipole gradient force (Fg) and scattering force (Fs) are present in a typical PiFM setup. Whereas Fs is insensitive to […] Read more