December 2017

Silicon Strain in Semiconductor Devices

PiFM Imaging of Local Strain in Silicon at Individual FIN Level Carrier mobility enhancement through local strain in silicon is a means of improving transistor performance. In order to effectively validate device design and process conditions, a direct measurement of strain in the nanoscale is desired. Here, we demonstrate true nanoscale strain mapping via PiFM […] Read more

Chemical Communications Cover 18 Dec 2017, Weckhuysen et al

Cover of Chemical Communications!

Our paper with Utrecht University, NL, was chosen for the cover of Chemical Communications, a journal published by the Royal Society of Chemistry. Special thanks to DongLong Fu in Dr. Bert Weckhuysen’s group, Debye Institute for Nanomaterials Science (DINS), Utrecht University, The Netherlands, and Katie Park, Molecular Vista, for their pivotal work on this exciting […] Read more

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